Constant voltage I-V curve flash tester for solar cells

William M. Keogh; Andrew W. Blakers; Andrés Cuevas

doi:10.1016/j.solmat.2003.11.001

Constant voltage I-V curve flash tester for solar cells

William M. Keogh^*, Andrew W. Blakers, Andrés Cuevas

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

Flash testers are commonly used for measuring solar cells and modules but in their usual implementation are complex, expensive, and susceptible to transient errors. This work presents a new tester design that is simple, low cost, and reduces transient errors by use of a constant-voltage cell-bias circuit. A novel feature of the system is that it extracts a family of I-V curves over a decade range of light intensity, which provides comprehensive information on cell performance. The new design has been tested and used extensively.

Original language	English
Pages (from-to)	183-196
Number of pages	14
Journal	Solar Energy Materials and Solar Cells
Volume	81
Issue number	2
DOIs	https://doi.org/10.1016/j.solmat.2003.11.001
Publication status	Published - 6 Feb 2004

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10.1016/j.solmat.2003.11.001

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title = "Constant voltage I-V curve flash tester for solar cells",

abstract = "Flash testers are commonly used for measuring solar cells and modules but in their usual implementation are complex, expensive, and susceptible to transient errors. This work presents a new tester design that is simple, low cost, and reduces transient errors by use of a constant-voltage cell-bias circuit. A novel feature of the system is that it extracts a family of I-V curves over a decade range of light intensity, which provides comprehensive information on cell performance. The new design has been tested and used extensively.",

keywords = "Concentrator cell characterisation, Flash tester, I-V curve, Transient error",

author = "Keogh, {William M.} and Blakers, {Andrew W.} and Andr{\'e}s Cuevas",

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T1 - Constant voltage I-V curve flash tester for solar cells

AU - Keogh, William M.

AU - Blakers, Andrew W.

AU - Cuevas, Andrés

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Y1 - 2004/2/6

N2 - Flash testers are commonly used for measuring solar cells and modules but in their usual implementation are complex, expensive, and susceptible to transient errors. This work presents a new tester design that is simple, low cost, and reduces transient errors by use of a constant-voltage cell-bias circuit. A novel feature of the system is that it extracts a family of I-V curves over a decade range of light intensity, which provides comprehensive information on cell performance. The new design has been tested and used extensively.

AB - Flash testers are commonly used for measuring solar cells and modules but in their usual implementation are complex, expensive, and susceptible to transient errors. This work presents a new tester design that is simple, low cost, and reduces transient errors by use of a constant-voltage cell-bias circuit. A novel feature of the system is that it extracts a family of I-V curves over a decade range of light intensity, which provides comprehensive information on cell performance. The new design has been tested and used extensively.

KW - Concentrator cell characterisation

KW - Flash tester

KW - I-V curve

KW - Transient error

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U2 - 10.1016/j.solmat.2003.11.001

DO - 10.1016/j.solmat.2003.11.001

M3 - Article

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VL - 81

SP - 183

EP - 196

JO - Solar Energy Materials and Solar Cells

JF - Solar Energy Materials and Solar Cells

IS - 2

ER -

Constant voltage I-V curve flash tester for solar cells

Abstract

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