Abstract
Flash testers are commonly used for measuring solar cells and modules but in their usual implementation are complex, expensive, and susceptible to transient errors. This work presents a new tester design that is simple, low cost, and reduces transient errors by use of a constant-voltage cell-bias circuit. A novel feature of the system is that it extracts a family of I-V curves over a decade range of light intensity, which provides comprehensive information on cell performance. The new design has been tested and used extensively.
| Original language | English |
|---|---|
| Pages (from-to) | 183-196 |
| Number of pages | 14 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 81 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 6 Feb 2004 |
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