Contact-induced defect propagation in ZnO

J. E. Bradby; S. O. Kucheyev; J. S. Williams; C. Jagadish; M. V. Swain; P. Munroe; M. R. Phillips

doi:10.1063/1.1486264

Contact-induced defect propagation in ZnO

J. E. Bradby, S. O. Kucheyev, J. S. Williams, C. Jagadish, M. V. Swain, P. Munroe, M. R. Phillips

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97 Citations (Scopus)

Abstract

Contact-induced damage has been studied in single-crystal (wurtzite) ZnO by cross-sectional transmission electron microscopy (XTEM) and scanning cathodoluminescence (CL) monochromatic imaging. XTEM reveals that the prime deformation mechanism in ZnO is the nucleation of slip on both the basal and pyramidal planes. Some indication of dislocation pinning was observed on the basal slip planes. No evidence of either a phase transformation or cracking was observed by XTEM in samples loaded up to 50 mN with an ∼4.2 μm radius spherical indenter. CL imaging reveals a quenching of near-gap emission by deformation-produced defects.Both XTEM and CL show that this comparatively soft material exhibits extensive deformation damage and that defects can propagate well beyond the deformed volume under contact. Results of this study have significant implications for the extent of contact-induced damage during fabrication of ZnO-based (opto)electronic devices.

Original language	English
Pages (from-to)	4537-4539
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	24
DOIs	https://doi.org/10.1063/1.1486264
Publication status	Published - 17 Jun 2002

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abstract = "Contact-induced damage has been studied in single-crystal (wurtzite) ZnO by cross-sectional transmission electron microscopy (XTEM) and scanning cathodoluminescence (CL) monochromatic imaging. XTEM reveals that the prime deformation mechanism in ZnO is the nucleation of slip on both the basal and pyramidal planes. Some indication of dislocation pinning was observed on the basal slip planes. No evidence of either a phase transformation or cracking was observed by XTEM in samples loaded up to 50 mN with an ∼4.2 μm radius spherical indenter. CL imaging reveals a quenching of near-gap emission by deformation-produced defects.Both XTEM and CL show that this comparatively soft material exhibits extensive deformation damage and that defects can propagate well beyond the deformed volume under contact. Results of this study have significant implications for the extent of contact-induced damage during fabrication of ZnO-based (opto)electronic devices.",

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AU - Bradby, J. E.

AU - Kucheyev, S. O.

AU - Williams, J. S.

AU - Jagadish, C.

AU - Swain, M. V.

AU - Munroe, P.

AU - Phillips, M. R.

PY - 2002/6/17

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Contact-induced defect propagation in ZnO

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