Contrast enhancement of luminescence images via point-spread deconvolution

Daniel Walter*, Anyao Liu, Evan Franklin, Daniel MacDonald, Bernhard Mitchell, Thorsten Trupke

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    46 Citations (Scopus)

    Abstract

    We investigate the impact of point-spread in the silicon CCD sensor of a BT Imaging LIS-R1 luminescence imaging system. It is found that an experimental definition of the point-spread function allows for a significant restoration of CCD point-spread to be achieved. A comparison with short-pass filtering is performed, demonstrating that point-spread will still have a measurable influence on image quality while reducing the luminescence signal and increasing the relative noise level. An implementation of point-spread deconvolution is presented at a multi-crystalline silicon grain boundary, illustrating a practical enhancement of resolution in a typical high-contrast scenario. The characteristics of the point-spread presented here are specific to the experimental apparatus investigated, but the procedure described is universally applicable.

    Original languageEnglish
    Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
    Pages307-312
    Number of pages6
    DOIs
    Publication statusPublished - 2012
    Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
    Duration: 3 Jun 20128 Jun 2012

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Conference

    Conference38th IEEE Photovoltaic Specialists Conference, PVSC 2012
    Country/TerritoryUnited States
    CityAustin, TX
    Period3/06/128/06/12

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