Cryogenic Steep Slope Field-Effect Transistors (invited talk)

J. Knoch*, B. Richstein, Y. Han, D. Konig, M. Frentzen, L. Hellmich, J. Klos, S. Scholz, Q. T. Zhao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The present paper studies with experiment and simulation a number of measures that improve current cryogenic MOSFETs to enable the device to be operated at very low supply voltages.

Original languageEnglish
Title of host publication2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages2
ISBN (Electronic)9781665459792
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022 - Honolulu, United States
Duration: 11 Jun 202212 Jun 2022

Conference

Conference2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
Country/TerritoryUnited States
CityHonolulu
Period11/06/2212/06/22

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