Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes

A S Khalil, Lewis Chadderton, AM Stewart, David Llewellyn, David Llewellyn, Mark C Ridgway, Aidan Byrne

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2
Journal	Microscopy and Microanalysis
Volume	19
Issue number	Sup 2
DOIs	https://doi.org/10.1017/S1431927613011963
Publication status	Published - 2013

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title = "Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes",

author = "Khalil, {A S} and Lewis Chadderton and AM Stewart and David Llewellyn and David Llewellyn and Ridgway, {Mark C} and Aidan Byrne",

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T1 - Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes

AU - Khalil, A S

AU - Chadderton, Lewis

AU - Stewart, AM

AU - Llewellyn, David

AU - Ridgway, Mark C

AU - Byrne, Aidan

PY - 2013

Y1 - 2013

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DO - 10.1017/S1431927613011963

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Sup 2

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