Density Estimation in X-ray Computed Tomography using the Alvarez-Macovski Model

Qiheng Yang, Nirjhor Chakraborty, Dmitry Lakshtanov, Adrian Sheppard, Andrew Kingston*

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    We introduce a method to extract density information from an x-ray computed tomography (XCT) volume that is more accurate than simply assuming density is proportional to CT number. XCT is a versatile tool for analysis, however, for lab-based XCT machines that employ polychromatic x-rays, it is difficult to extract anything more than the crudest quantitative data from the sample. Reconstructed tomograms values are, in theory, the x-ray attenuation coefficients of the material. However, due to the polychromatic nature of the beam, and effects such as beam hardening, such an interpretation of real data is rarely feasible. The Alvarez-Macovski (AM) equation, which is used in quantitative XCT reconstruction algorithms, provides a model of x-ray attenuation. We use the AM equation to extract quantitative information from conventionally reconstructed tomograms, provided it is not too severely affected by beam-hardening artefacts. In essence, we assume that the tomogram values are proportional to the attenuation coefficients of the AM equation at a mean x-ray energy. Then, given a calibration scan which contains enough materials, we can solve the AM equation for the unknown coefficients and exponents. We then apply it to tomograms of objects with similar shape and material composition. The quantitative data extracted thus provides a more accurate estimate of both per-material density and bulk density.

    Original languageEnglish
    Title of host publicationDevelopments in X-Ray Tomography XIII
    EditorsBert Muller, Ge Wang
    PublisherSPIE
    ISBN (Electronic)9781510645189
    DOIs
    Publication statusPublished - 2021
    EventDevelopments in X-Ray Tomography XIII 2021 - San Diego, United States
    Duration: 1 Aug 20215 Aug 2021

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume11840
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    ConferenceDevelopments in X-Ray Tomography XIII 2021
    Country/TerritoryUnited States
    CitySan Diego
    Period1/08/215/08/21

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