Depth and surface normal estimation from monocular images using regression on deep features and hierarchical CRFs

Bo Li, Chunhua Shen, Yuchao Dai, Anton Van Den Hengel, Mingyi He

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    564 Citations (Scopus)

    Abstract

    Predicting the depth (or surface normal) of a scene from single monocular color images is a challenging task. This paper tackles this challenging and essentially underdetermined problem by regression on deep convolutional neural network (DCNN) features, combined with a post-processing refining step using conditional random fields (CRF). Our framework works at two levels, super-pixel level and pixel level. First, we design a DCNN model to learn the mapping from multi-scale image patches to depth or surface normal values at the super-pixel level. Second, the estimated super-pixel depth or surface normal is refined to the pixel level by exploiting various potentials on the depth or surface normal map, which includes a data term, a smoothness term among super-pixels and an auto-regression term characterizing the local structure of the estimation map. The inference problem can be efficiently solved because it admits a closed-form solution. Experiments on the Make3D and NYU Depth V2 datasets show competitive results compared with recent state-of-the-art methods.

    Original languageEnglish
    Title of host publicationIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
    PublisherIEEE Computer Society
    Pages1119-1127
    Number of pages9
    ISBN (Electronic)9781467369640
    DOIs
    Publication statusPublished - 14 Oct 2015
    EventIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015 - Boston, United States
    Duration: 7 Jun 201512 Jun 2015

    Publication series

    NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
    Volume07-12-June-2015
    ISSN (Print)1063-6919

    Conference

    ConferenceIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
    Country/TerritoryUnited States
    CityBoston
    Period7/06/1512/06/15

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