Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

Frances E. Jenner; Peter Holden; John A. Mavrogenes; Hugh St C. O'Neill; Charlotte Allen

doi:10.1111/j.1751-908X.2009.00024.x

Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

Frances E. Jenner^*, Peter Holden, John A. Mavrogenes, Hugh St C. O'Neill, Charlotte Allen

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g^-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g^-1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g^-1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g^-1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g^-1.

Original language	English
Pages (from-to)	309-317
Number of pages	9
Journal	Geostandards and Geoanalytical Research
Volume	33
Issue number	3
DOIs	https://doi.org/10.1111/j.1751-908X.2009.00024.x
Publication status	Published - Sept 2009

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@article{04a1333e0ee04e46af949e12aa5ec67e,

title = "Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II",

abstract = "A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g-1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g-1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g-1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g-1.",

keywords = "BCR-2G, EMPA, LA-ICP-MS, MPI-DING, NIST SRM, Reference materials, SHRIMP, Selenium",

author = "Jenner, {Frances E.} and Peter Holden and Mavrogenes, {John A.} and O'Neill, {Hugh St C.} and Charlotte Allen",

year = "2009",

month = sep,

doi = "10.1111/j.1751-908X.2009.00024.x",

language = "English",

volume = "33",

pages = "309--317",

journal = "Geostandards and Geoanalytical Research",

issn = "1639-4488",

publisher = "Wiley-Blackwell",

number = "3",

}

Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II. / Jenner, Frances E.; Holden, Peter; Mavrogenes, John A. et al.
In: Geostandards and Geoanalytical Research, Vol. 33, No. 3, 09.2009, p. 309-317.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

AU - Jenner, Frances E.

AU - Holden, Peter

AU - Mavrogenes, John A.

AU - O'Neill, Hugh St C.

AU - Allen, Charlotte

PY - 2009/9

Y1 - 2009/9

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AB - A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g-1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g-1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g-1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g-1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g-1.

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ER -

Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

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