Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements

Keith R. McIntosh; Lachlan E. Black; Simeon C. Baker-Finch; Teng C. Kho; Yimao Y. Wan

doi:10.1016/j.egypro.2012.02.019

Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements

Keith R. McIntosh^*, Lachlan E. Black, Simeon C. Baker-Finch, Teng C. Kho, Yimao Y. Wan

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

This paper describes how capacitance-voltage (CV) and Kelvin probe (KP) measurements can be combined to determine the magnitude and centroid of the electric charge in a thin-film insulator. The technique is demonstrated on three films of relevance to silicon solar cells: aluminium oxide, amorphous silicon nitride and silicon dioxide. Since the charge within these films is of different magnitudes, locations and polarity, they offer a good selection with which to demonstrate the combined CV and KP technique.

Original language	English
Pages (from-to)	162-170
Number of pages	9
Journal	Energy Procedia
Volume	15
DOIs	https://doi.org/10.1016/j.egypro.2012.02.019
Publication status	Published - 2012
Event	6th International Conference on Materials for Advanced Technologies, ICMAT 2011 - Singapore, Singapore Duration: 26 Jun 2011 → 1 Jul 2011

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10.1016/j.egypro.2012.02.019

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title = "Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements",

abstract = "This paper describes how capacitance-voltage (CV) and Kelvin probe (KP) measurements can be combined to determine the magnitude and centroid of the electric charge in a thin-film insulator. The technique is demonstrated on three films of relevance to silicon solar cells: aluminium oxide, amorphous silicon nitride and silicon dioxide. Since the charge within these films is of different magnitudes, locations and polarity, they offer a good selection with which to demonstrate the combined CV and KP technique.",

keywords = "Charge, Dielectrics, Photovoltaics, Surface passivation",

author = "McIntosh, {Keith R.} and Black, {Lachlan E.} and Baker-Finch, {Simeon C.} and Kho, {Teng C.} and Wan, {Yimao Y.}",

year = "2012",

doi = "10.1016/j.egypro.2012.02.019",

language = "English",

volume = "15",

pages = "162--170",

journal = "Energy Procedia",

issn = "1876-6102",

publisher = "Elsevier B.V.",

note = "6th International Conference on Materials for Advanced Technologies, ICMAT 2011 ; Conference date: 26-06-2011 Through 01-07-2011",

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T1 - Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements

AU - McIntosh, Keith R.

AU - Black, Lachlan E.

AU - Baker-Finch, Simeon C.

AU - Kho, Teng C.

AU - Wan, Yimao Y.

PY - 2012

Y1 - 2012

N2 - This paper describes how capacitance-voltage (CV) and Kelvin probe (KP) measurements can be combined to determine the magnitude and centroid of the electric charge in a thin-film insulator. The technique is demonstrated on three films of relevance to silicon solar cells: aluminium oxide, amorphous silicon nitride and silicon dioxide. Since the charge within these films is of different magnitudes, locations and polarity, they offer a good selection with which to demonstrate the combined CV and KP technique.

AB - This paper describes how capacitance-voltage (CV) and Kelvin probe (KP) measurements can be combined to determine the magnitude and centroid of the electric charge in a thin-film insulator. The technique is demonstrated on three films of relevance to silicon solar cells: aluminium oxide, amorphous silicon nitride and silicon dioxide. Since the charge within these films is of different magnitudes, locations and polarity, they offer a good selection with which to demonstrate the combined CV and KP technique.

KW - Charge

KW - Dielectrics

KW - Photovoltaics

KW - Surface passivation

UR - http://www.scopus.com/inward/record.url?scp=84860515164&partnerID=8YFLogxK

U2 - 10.1016/j.egypro.2012.02.019

DO - 10.1016/j.egypro.2012.02.019

M3 - Conference article

SN - 1876-6102

VL - 15

SP - 162

EP - 170

JO - Energy Procedia

JF - Energy Procedia

T2 - 6th International Conference on Materials for Advanced Technologies, ICMAT 2011

Y2 - 26 June 2011 through 1 July 2011

ER -

Determination of the magnitude and centroid of the charge in a thin-film insulator by CV and Kelvin probe measurements

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