Skip to main navigation Skip to search Skip to main content

Determining the charge states and capture mechanisms of defects in silicon through accurate recombination analyses: A review

  • Fiacre E. Rougieux*
  • , Chang Sun
  • , Daniel Macdonald
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    42 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Determining the charge states and capture mechanisms of defects in silicon through accurate recombination analyses: A review'. Together they form a unique fingerprint.
    Sort by

    Engineering

    Material Science

    Chemistry