@inproceedings{d0dee60dbd794d16bf5e1abe7bc56e4d,
title = "Determining the generation profile for silicon solar cells from lumped optical parameters",
abstract = "An optical model for silicon solar cells that determines the generation profile G from the lumped parameters front surface transmission Text and pathlength enhancement Z is investigated. Simpler than the well-known 'Basore model', it links effective (measurable) optical and electrical characteristics of solar cells with G. By comparisons against ray tracing the model is found to be accurate for typical wafer-based silicon solar cells, with the error in short-circuit current density being less than 0.1 mA/cm2 for a wide range of conditions. The model provides a minimalistic way to calculate G from the characterization of finished cells, and a short-cut for ray tracing, which calculates Text and Z with significantly less computational effort than G. In combination with a recently proposed thickness-independent parameterization of Z, it enables simple, rapid and accurate sweeping of cell thickness within solar cell device modeling.",
keywords = "device simulation, pathlength enhancement, ray tracing, solar cell modeling, solar cell optics",
author = "Andreas Fell and McIntosh, {Keith R.}",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 ; Conference date: 14-06-2015 Through 19-06-2015",
year = "2015",
month = dec,
day = "14",
doi = "10.1109/PVSC.2015.7355952",
language = "English",
series = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",
address = "United States",
}