Development of Scanning Methods in AFM Imaging

An atomic force microscope (AFM) is a scientific instrument capable of investigating, controlling, and manipulating matter on a nanoscale. It is a fundamental part of research in the field of nanotechnology because of its capability to obtain threedimensional images of specimens in the areas of life sciences and material science. However, the imaging performances of currently available AFMs are influenced by their conventional zigzag raster pattern scanning method. This is due to the presence of high frequency harmonics of the triangular signal which excites the tube resonance at high scanning speeds. Over the last two decades, several works have attempted to overcome this issue in order to meet current demands. This article presents an overview of the developments in scanning techniques for high-speed AFM imaging.