Direct imaging of the spatial diffusion of excitons in single semiconductor nanowires

M. A. Fickenscher, H. E. Jackson, L. M. Smith*, J. M. Yarrison-Rice, J. H. Kang, S. Paiman, Q. Gao, H. H. Tan, C. Jagadish

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    13 Citations (Scopus)

    Abstract

    We use spatially and temporally resolved photoluminescence to measure exciton diffusion in single zinc blende GaAs/AlGaAs core/shell and mixed phase InP nanowires. Excitons in the single phase GaAs/AlGaAs nanowires are seen to diffuse rapidly throughout the nanowire with a measured diffusion constant ranging from 45 to 100 cm 2/s, while in the mixed phase, InP nanowire electrons and holes are seen to rapidly localize to the quantum confined states in the zinc blende and wurtzite segments, respectively. The diffusion constant in the GaAs/AlGaAs nanowire is similar to the best hole mobilities observed in modulation doped heterostructures.

    Original languageEnglish
    Article number263110
    JournalApplied Physics Letters
    Volume99
    Issue number26
    DOIs
    Publication statusPublished - 26 Dec 2011

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