Direct measurement of spectral momentum densities of ordered and disordered semiconductors by high energy EMS

C. Bowles*, M. R. Went, A. S. Kheifets, M. Vos

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Citations (Scopus)

    Abstract

    High Energy solid state electron momentum spectroscopy (EMS) is capable of directly measuring spectral functions of ordered and disordered solid matter. In this paper we investigate the spectral functions for the group IV semiconductors Ge and Si. We attempt to resolve the electronic structure differences in amorphous, polycrystalline and crystalline atomic arrangements of the semiconductors. We examine the experimental differences in polycrystalline and amorphous Ge, and draw conclusions as to the similarities/differences between the two states of matter.

    Original languageEnglish
    Title of host publicationProceedings of the International Symposium on (e,2e), Double Photoionization and Related Topics and the 13th International Symposium on Polarization and Correlation in Electronic and Atomic Collisions
    Pages167-172
    Number of pages6
    DOIs
    Publication statusPublished - 2006
    EventInternational Symposium on (e,2e), Double Photoionization and Related Topics and the 13th International Symposium on Polarization and Correlation in Electronic and Atomic Collisions - Buenos Aires, Argentina
    Duration: 28 Jul 200530 Jul 2005

    Publication series

    NameAIP Conference Proceedings
    Volume811
    ISSN (Print)0094-243X
    ISSN (Electronic)1551-7616

    Conference

    ConferenceInternational Symposium on (e,2e), Double Photoionization and Related Topics and the 13th International Symposium on Polarization and Correlation in Electronic and Atomic Collisions
    Country/TerritoryArgentina
    CityBuenos Aires
    Period28/07/0530/07/05

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