Direct observation of defect levels in InN by soft X-ray absorption spectroscopy

M. Petravic; P. N.K. Deenapanray; M. D. Fraser; A. V. Soldatov; Y. W. Yang; P. A. Anderson; S. M. Durbin

doi:10.1021/jp057140l

Direct observation of defect levels in InN by soft X-ray absorption spectroscopy

M. Petravic^*, P. N.K. Deenapanray, M. D. Fraser, A. V. Soldatov, Y. W. Yang, P. A. Anderson, S. M. Durbin

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

We have used synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to study the electronic structure of nitrogen-related defects in InN(0001). Several defect levels within the band gap or the conduction band of InN were clearly resolved in NEXAFS spectra around the nitrogen K-edge. We attribute the level observed at 0.3 eV below the conduction band minimum (CBM) to interstitial nitrogen, the level at 1.7 eV above the CBM to antisite nitrogen, and a sharp resonance at 3.2 eV above the CBM to molecular nitrogen, in full agreement with theoretical simulations.

Original language	English
Pages (from-to)	2984-2987
Number of pages	4
Journal	Journal of Physical Chemistry B
Volume	110
Issue number	7
DOIs	https://doi.org/10.1021/jp057140l
Publication status	Published - 23 Feb 2006

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@article{2c85b18e25b1409cbb1b9e52533de6e5,

title = "Direct observation of defect levels in InN by soft X-ray absorption spectroscopy",

abstract = "We have used synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to study the electronic structure of nitrogen-related defects in InN(0001). Several defect levels within the band gap or the conduction band of InN were clearly resolved in NEXAFS spectra around the nitrogen K-edge. We attribute the level observed at 0.3 eV below the conduction band minimum (CBM) to interstitial nitrogen, the level at 1.7 eV above the CBM to antisite nitrogen, and a sharp resonance at 3.2 eV above the CBM to molecular nitrogen, in full agreement with theoretical simulations.",

author = "M. Petravic and Deenapanray, {P. N.K.} and Fraser, {M. D.} and Soldatov, {A. V.} and Yang, {Y. W.} and Anderson, {P. A.} and Durbin, {S. M.}",

year = "2006",

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doi = "10.1021/jp057140l",

language = "English",

volume = "110",

pages = "2984--2987",

journal = "Journal of Physical Chemistry B",

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TY - JOUR

T1 - Direct observation of defect levels in InN by soft X-ray absorption spectroscopy

AU - Petravic, M.

AU - Deenapanray, P. N.K.

AU - Fraser, M. D.

AU - Soldatov, A. V.

AU - Yang, Y. W.

AU - Anderson, P. A.

AU - Durbin, S. M.

PY - 2006/2/23

Y1 - 2006/2/23

N2 - We have used synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to study the electronic structure of nitrogen-related defects in InN(0001). Several defect levels within the band gap or the conduction band of InN were clearly resolved in NEXAFS spectra around the nitrogen K-edge. We attribute the level observed at 0.3 eV below the conduction band minimum (CBM) to interstitial nitrogen, the level at 1.7 eV above the CBM to antisite nitrogen, and a sharp resonance at 3.2 eV above the CBM to molecular nitrogen, in full agreement with theoretical simulations.

AB - We have used synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to study the electronic structure of nitrogen-related defects in InN(0001). Several defect levels within the band gap or the conduction band of InN were clearly resolved in NEXAFS spectra around the nitrogen K-edge. We attribute the level observed at 0.3 eV below the conduction band minimum (CBM) to interstitial nitrogen, the level at 1.7 eV above the CBM to antisite nitrogen, and a sharp resonance at 3.2 eV above the CBM to molecular nitrogen, in full agreement with theoretical simulations.

UR - http://www.scopus.com/inward/record.url?scp=33644884717&partnerID=8YFLogxK

U2 - 10.1021/jp057140l

DO - 10.1021/jp057140l

M3 - Article

SN - 1520-6106

VL - 110

SP - 2984

EP - 2987

JO - Journal of Physical Chemistry B

JF - Journal of Physical Chemistry B

IS - 7

ER -

Direct observation of defect levels in InN by soft X-ray absorption spectroscopy

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