Direct observation of irradiation-induced nanocavity shrinkage in Si

X. F. Zhu*, J. S. Williams, M. J. Conway, M. C. Ridgway, F. Fortuna, M. O. Ruault, H. Bernas

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    34 Citations (Scopus)

    Abstract

    Nanocavities in Si substrates, formed by conventional H implantation and thermal annealing, are shown to evolve in size during subsequent Si irradiation. Both ex situ and in situ analytical techniques were used to demonstrate that the mean nanocavity diameter decreases as a function of Si irradiation dose in both the crystalline and amorphous phases. Potential mechanisms for this irradiation-induced nanocavity evolution are discussed. In the crystalline phase, the observed decrease in diameter is attributed to the gettering of interstitials. When the matrix surrounding the cavities is amorphized, cavity shrinkage may be mediated by one of two processes: nanocavities can supply vacancies into the amorphous phase and/or the amorphous phase may flow plastically into the nanocavities. Both processes yield the necessary decrease in density of the amorphous phase relative to crystalline material.

    Original languageEnglish
    Pages (from-to)3416-3418
    Number of pages3
    JournalApplied Physics Letters
    Volume79
    Issue number21
    DOIs
    Publication statusPublished - 19 Nov 2001

    Fingerprint

    Dive into the research topics of 'Direct observation of irradiation-induced nanocavity shrinkage in Si'. Together they form a unique fingerprint.

    Cite this