Direct observation of substitutional Ga after ion implantation in Ge by means of extended x-ray absorption fine structure
- S. Decoster*
- , B. Johannessen
- , C. J. Glover
- , S. Cottenier
- , T. Bierschenk
- , H. Salama
- , F. Kremer
- , K. Temst
- , A. Vantomme
- , M. C. Ridgway
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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