Abstract
A review of the application of electron microscopy to disordered materials exhibiting sharp, highly structured diffuse intensity distributions is given from a modulation wave approach perspective. Structurally useful diffraction phenomena such as polarization, overall diffuse distribution shape and pseudo-extinction conditions are highlighted. The dangers of multiple scattering are emphasized before two particular such systems, substitutionally disordered solid solutions and inherently flexible framework structures are considered in more detail.
| Original language | English |
|---|---|
| Pages (from-to) | 1027-1034 |
| Number of pages | 8 |
| Journal | Zeitschfrift fur Kristallographie |
| Volume | 220 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 2005 |