Distributions of self-trapped hole continuums in silica glass

R. P. Wang; K. Saito; A. J. Ikushima

doi:10.1063/1.2216350

Distributions of self-trapped hole continuums in silica glass

R. P. Wang^*, K. Saito, A. J. Ikushima

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Photobleaching of self-trapped holes (STH) in low temperature UV-irradiated silica glass has been investigated by the electron spin resonance method. The bleaching time dependence of the decay of two kinds of STH, STH₁ and STH₂, could be well fitted by the stretched exponential function, and STH₂ has a quicker decay than STH₁. On the other hand, the decay becomes significant large when the photon energy increases from 1.5 to 2.0 eV, and then keeps constant with a further increase of photon energy. The distributions of the STH continuums are estimated at the positions on top of the valence band, being 1.66±0.27 eV for STH₁ and 1.63±0.33 eV for STH₂. A possible recombination mechanism is proposed to explain the decay of STH signals.

Original language	English
Article number	013706
Journal	Journal of Applied Physics
Volume	100
Issue number	1
DOIs	https://doi.org/10.1063/1.2216350
Publication status	Published - 2006

Access to Document

10.1063/1.2216350

Cite this

@article{90b28c79b3a3444f9a8d08a5216f4787,

title = "Distributions of self-trapped hole continuums in silica glass",

abstract = "Photobleaching of self-trapped holes (STH) in low temperature UV-irradiated silica glass has been investigated by the electron spin resonance method. The bleaching time dependence of the decay of two kinds of STH, STH1 and STH2, could be well fitted by the stretched exponential function, and STH2 has a quicker decay than STH1. On the other hand, the decay becomes significant large when the photon energy increases from 1.5 to 2.0 eV, and then keeps constant with a further increase of photon energy. The distributions of the STH continuums are estimated at the positions on top of the valence band, being 1.66±0.27 eV for STH1 and 1.63±0.33 eV for STH2. A possible recombination mechanism is proposed to explain the decay of STH signals.",

author = "Wang, {R. P.} and K. Saito and Ikushima, {A. J.}",

year = "2006",

doi = "10.1063/1.2216350",

language = "English",

volume = "100",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Distributions of self-trapped hole continuums in silica glass

AU - Wang, R. P.

AU - Saito, K.

AU - Ikushima, A. J.

PY - 2006

Y1 - 2006

N2 - Photobleaching of self-trapped holes (STH) in low temperature UV-irradiated silica glass has been investigated by the electron spin resonance method. The bleaching time dependence of the decay of two kinds of STH, STH1 and STH2, could be well fitted by the stretched exponential function, and STH2 has a quicker decay than STH1. On the other hand, the decay becomes significant large when the photon energy increases from 1.5 to 2.0 eV, and then keeps constant with a further increase of photon energy. The distributions of the STH continuums are estimated at the positions on top of the valence band, being 1.66±0.27 eV for STH1 and 1.63±0.33 eV for STH2. A possible recombination mechanism is proposed to explain the decay of STH signals.

AB - Photobleaching of self-trapped holes (STH) in low temperature UV-irradiated silica glass has been investigated by the electron spin resonance method. The bleaching time dependence of the decay of two kinds of STH, STH1 and STH2, could be well fitted by the stretched exponential function, and STH2 has a quicker decay than STH1. On the other hand, the decay becomes significant large when the photon energy increases from 1.5 to 2.0 eV, and then keeps constant with a further increase of photon energy. The distributions of the STH continuums are estimated at the positions on top of the valence band, being 1.66±0.27 eV for STH1 and 1.63±0.33 eV for STH2. A possible recombination mechanism is proposed to explain the decay of STH signals.

UR - http://www.scopus.com/inward/record.url?scp=33746191684&partnerID=8YFLogxK

U2 - 10.1063/1.2216350

DO - 10.1063/1.2216350

M3 - Article

SN - 0021-8979

VL - 100

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 1

M1 - 013706

ER -

Distributions of self-trapped hole continuums in silica glass

Abstract

Access to Document

Other files and links

Fingerprint

Cite this