Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence

S. Y. Lim*, S. P. Phang, T. Trupke, A. Cuevas, D. MacDonald

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    15 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence'. Together they form a unique fingerprint.

    Engineering

    Material Science