Dynamics of light-induced reflectivity switching in gallium films deposited on silica by pulsed laser ablation

A. V. Rode*, M. Samoc, B. Luther-Davies, E. G. Gamaly, K. F. MacDonald, N. I. Zheludev

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    29 Citations (Scopus)

    Abstract

    We present what is to our knowledge the first experimental study of light-induced reflectivity changes at an α-Ga/Si interface irradiated by femtosecond and picosecond laser pulses. After exposure, the reflectivity can increase from R ≅ 0.55, which is typical for α-Ga, to R ≅ 0.8, which is close to that of liquid Ga. The initial step in the reflectivity change of 2-4 ps is resolved with 150-fs laser pulses. The light-induced reflectivity change relaxes during 100 ns-10 μs, depending strongly on the background temperature of the Ga mirror and the laser fluence.

    Original languageEnglish
    Pages (from-to)441-443
    Number of pages3
    JournalOptics Letters
    Volume26
    Issue number7
    DOIs
    Publication statusPublished - 1 Apr 2001

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