Abstract
We present what is to our knowledge the first experimental study of light-induced reflectivity changes at an α-Ga/Si interface irradiated by femtosecond and picosecond laser pulses. After exposure, the reflectivity can increase from R ≅ 0.55, which is typical for α-Ga, to R ≅ 0.8, which is close to that of liquid Ga. The initial step in the reflectivity change of 2-4 ps is resolved with 150-fs laser pulses. The light-induced reflectivity change relaxes during 100 ns-10 μs, depending strongly on the background temperature of the Ga mirror and the laser fluence.
Original language | English |
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Pages (from-to) | 441-443 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 26 |
Issue number | 7 |
DOIs | |
Publication status | Published - 1 Apr 2001 |