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Effect of a High Density of Stacking Faults on the Young's Modulus of GaAs Nanowires
Yujie Chen, Tim Burgess, Xianghai An, Yiu Wing Mai, H. Hoe Tan, Jin Zou, Simon P. Ringer, Chennupati Jagadish, Xiaozhou Liao*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
65
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(Scopus)