Abstract
Wurtzite GaN films bombarded with 40 keV C ions to high doses (5× 1017 and 1× 1018 cm-2) are studied by a combination of Rutherford backscattering/channeling spectrometry, transmission electron microscopy, and soft x-ray absorption spectroscopy. Results show that, contrary to other ion species, implanted C forms nitrilelike carbon-nitride bonds (CN) and suppresses ion-beam-induced material decomposition involving the formation and agglomeration of 5-nm -large N2 gas bubbles.
Original language | English |
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Article number | 261905 |
Journal | Applied Physics Letters |
Volume | 91 |
Issue number | 26 |
DOIs | |
Publication status | Published - 2007 |