Effects of carbon on ion-implantation-induced disorder in GaN

S. O. Kucheyev*, J. E. Bradby, C. P. Li, S. Ruffell, T. Van Buuren, T. E. Felter

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    25 Citations (Scopus)

    Abstract

    Wurtzite GaN films bombarded with 40 keV C ions to high doses (5× 1017 and 1× 1018 cm-2) are studied by a combination of Rutherford backscattering/channeling spectrometry, transmission electron microscopy, and soft x-ray absorption spectroscopy. Results show that, contrary to other ion species, implanted C forms nitrilelike carbon-nitride bonds (CN) and suppresses ion-beam-induced material decomposition involving the formation and agglomeration of 5-nm -large N2 gas bubbles.

    Original languageEnglish
    Article number261905
    JournalApplied Physics Letters
    Volume91
    Issue number26
    DOIs
    Publication statusPublished - 2007

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