TY - GEN
T1 - Efficient learning to label images
AU - Jia, Ke
AU - Cheng, Li
AU - Liu, Nianjun
AU - Wang, Lei
PY - 2010
Y1 - 2010
N2 - Conditional random field methods (CRFs) have gained popularity for image labeling tasks in recent years. In this paper, we describe an alternative discriminative approach, by extending the large margin principle to incorporate spatial correlations among neighboring pixels. In particular, by explicitly enforcing the submodular condition, graph-cuts is conveniently integrated as the inference engine to attain the optimal label assignment efficiently. Our approach allows learning a model with thousands of parameters, and is shown to be capable of readily incorporating higher-order scene context. Empirical studies on a variety of image datasets suggest that our approach performs competitively compared to the state-of-the-art scene labeling methods.
AB - Conditional random field methods (CRFs) have gained popularity for image labeling tasks in recent years. In this paper, we describe an alternative discriminative approach, by extending the large margin principle to incorporate spatial correlations among neighboring pixels. In particular, by explicitly enforcing the submodular condition, graph-cuts is conveniently integrated as the inference engine to attain the optimal label assignment efficiently. Our approach allows learning a model with thousands of parameters, and is shown to be capable of readily incorporating higher-order scene context. Empirical studies on a variety of image datasets suggest that our approach performs competitively compared to the state-of-the-art scene labeling methods.
UR - http://www.scopus.com/inward/record.url?scp=78149491985&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2010.236
DO - 10.1109/ICPR.2010.236
M3 - Conference contribution
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 942
EP - 945
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -