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Electrical characterization of semiconductor nanowires by scanning tunneling microscopy

Corentin Durand, Pierre Capoid, M. Berthe, Tao Xu, Jean Philippe Nys, Renaud Leturcq, Ph Caroff, Bruno Grandidier

    Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › peer-review

    3 Citations (Scopus)

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