Electron and trap dynamics in As-ion-implanted and annealed GaAs

L. Giniũnas, R. Danielius, H. H. Tan, C. Jagadish, R. Adomavičius, A. Krotkus*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    The ultrafast dynamics of As-ion-implanted and annealed GaAs is investigated using transmission pump-probe measurements. Carrier recombination time was found to increase from 4 to 40 ps with increasing annealing temperature. At lower annealing temperatures, the transmitted optical signal is dominated by induced absorption and at higher annealing temperatures this effect is replaced by induced transparency.

    Original languageEnglish
    Pages (from-to)1667-1669
    Number of pages3
    JournalApplied Physics Letters
    Volume78
    Issue number12
    DOIs
    Publication statusPublished - 19 Mar 2001

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