TY - JOUR
T1 - Electronic and optical nature of silicon nanostructures: doping, interface effects and strain
T2 - Proceedings of the 2015 E-MRS Fall Meeting, Symposium P
AU - Hiller, Daniel
AU - Koenig, Dirk
AU - Kůsová, Katerina
N1 - Publisher Copyright:
© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
PY - 2016/4/1
Y1 - 2016/4/1
N2 - This proceedings volume of phys. status solidi (c) contains research presented in Symposium P at the EMRS 2015 Fall Meeting in Warsaw, Poland. The symposium focused on silicon nanostructures in all dimensionalities and intended to cover theoretical, experimental and application aspects with emphasize on doping, surface/interface effects, and advanced metrology methods. Besides the well-known size dependent quantum confinement effects, Si nanostructures are highly susceptible to their surrounding and any kind of impurities. Many key material properties change due to the influence of an embedding matrix or surface terminating groups. On the other hand, well established technological concepts such as majority carrier generation by impurity doping with e.g. phosphorous or boron are impeded in Si nanostructures due to self-purification, statistical problems, or failing dopant ionization due to quantum confinement. In the course of the symposium, details on these problems but also approaches on how to circumvent or exploit these effects for novel functionalities or applications were presented and discussed. We thank all invited and contributed speakers as well as all presenters of posters. Furthermore, we appreciate the help and support of our sponsors and the editorial team of pss (c). (© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
AB - This proceedings volume of phys. status solidi (c) contains research presented in Symposium P at the EMRS 2015 Fall Meeting in Warsaw, Poland. The symposium focused on silicon nanostructures in all dimensionalities and intended to cover theoretical, experimental and application aspects with emphasize on doping, surface/interface effects, and advanced metrology methods. Besides the well-known size dependent quantum confinement effects, Si nanostructures are highly susceptible to their surrounding and any kind of impurities. Many key material properties change due to the influence of an embedding matrix or surface terminating groups. On the other hand, well established technological concepts such as majority carrier generation by impurity doping with e.g. phosphorous or boron are impeded in Si nanostructures due to self-purification, statistical problems, or failing dopant ionization due to quantum confinement. In the course of the symposium, details on these problems but also approaches on how to circumvent or exploit these effects for novel functionalities or applications were presented and discussed. We thank all invited and contributed speakers as well as all presenters of posters. Furthermore, we appreciate the help and support of our sponsors and the editorial team of pss (c). (© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
UR - http://www.scopus.com/inward/record.url?scp=84963787685&partnerID=8YFLogxK
U2 - 10.1002/pssc.201670121
DO - 10.1002/pssc.201670121
M3 - Editorial
AN - SCOPUS:84963787685
SN - 1862-6351
VL - 13
SP - 133
EP - 133
JO - Physica Status Solidi (C) Current Topics in Solid State Physics
JF - Physica Status Solidi (C) Current Topics in Solid State Physics
IS - 4
ER -