Electronic properties and metrology applications of the diamond NV - Center under pressure

Marcus W. Doherty^*, Viktor V. Struzhkin, David A. Simpson, Liam P. McGuinness, Yufei Meng, Alastair Stacey, Timothy J. Karle, Russell J. Hemley, Neil B. Manson, Lloyd C.L. Hollenberg, Steven Prawer

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review