Abstract
Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.
Original language | English |
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Pages (from-to) | 328-338 |
Number of pages | 11 |
Journal | Materials Characterization |
Volume | 123 |
DOIs | |
Publication status | Published - 1 Jan 2017 |