Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

Maarten Vos; Aimo Winkelmann

doi:10.1016/j.matchar.2016.11.043

Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

Maarten Vos^*, Aimo Winkelmann

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.

Original language	English
Pages (from-to)	328-338
Number of pages	11
Journal	Materials Characterization
Volume	123
DOIs	https://doi.org/10.1016/j.matchar.2016.11.043
Publication status	Published - 1 Jan 2017

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10.1016/j.matchar.2016.11.043

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@article{88a87c7bf1054cdcb81cfd9842f8213f,

title = "Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials",

abstract = "Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.",

keywords = "Electron Rutherford backscattering, Electron backscatter diffraction, Electrostatic analyser, Gallium phosphide, Non-centro symmetric crystals",

author = "Maarten Vos and Aimo Winkelmann",

note = "Publisher Copyright: {\textcopyright} 2016 Elsevier Inc.",

year = "2017",

month = jan,

day = "1",

doi = "10.1016/j.matchar.2016.11.043",

language = "English",

volume = "123",

pages = "328--338",

journal = "Materials Characterization",

issn = "1044-5803",

publisher = "Elsevier Inc.",

}

TY - JOUR

T1 - Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

AU - Vos, Maarten

AU - Winkelmann, Aimo

PY - 2017/1/1

Y1 - 2017/1/1

N2 - Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.

AB - Angle-resolved electron Rutherford backscattering (ERBS) measurements using an electrostatic electron energy analyser can provide unique access to element-resolved crystallographic information. We present Kikuchi pattern measurements of the non-centrosymmetric crystal GaP, separately resolving the contributions of electrons backscattered from Ga and P. In comparison to element-integrated measurements like in the method of electron backscatter diffraction (EBSD), the effect of the absence of a proper 4-fold rotation axis in the point group of GaP can be sensed with a much higher visibility via the element-resolved Ga to P intensity ratio. These element-resolved measurements make it possible to experimentally attribute the previously observed point-group dependent effect in element-integrated EBSD measurements to the larger contribution of electrons scattered from Ga compared to P.

KW - Electron Rutherford backscattering

KW - Electron backscatter diffraction

KW - Electrostatic analyser

KW - Gallium phosphide

KW - Non-centro symmetric crystals

UR - https://www.scopus.com/pages/publications/85000645624

U2 - 10.1016/j.matchar.2016.11.043

DO - 10.1016/j.matchar.2016.11.043

M3 - Article

SN - 1044-5803

VL - 123

SP - 328

EP - 338

JO - Materials Characterization

JF - Materials Characterization

ER -

Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials

Abstract

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