Original language | English |
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Title of host publication | Correlation Spectroscopy of Surfaces, Thin Films, and Nanostructures |
Editors | J. Berakdar, J. Kirschner |
Place of Publication | Weinheim |
Publisher | Wiley-VCH Verlag GmbH |
Pages | 83-104 |
Volume | 1 |
Edition | 1 |
ISBN (Print) | 3527404775 |
Publication status | Published - 2004 |
EMS Measurements of the Valence Spectral Function of Silicon - A Test of Many-Body Theory
Cameron A Bowles, Anatoli Kheifets, Vladimir Sashin, Maarten Vos, Erich Weigold, Ferdi Aryasetiawan
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review