TY - GEN
T1 - Estimation of acoustic impedance from multiple ultrasound images with application to spatial compounding
AU - Wachinger, Christian
AU - Shams, Ramtin
AU - Navab, Nassir
PY - 2008
Y1 - 2008
N2 - Reflection of sound waves, due to acoustic impedance mismatch at the interface of two media, is the principal physical property which allows visualization with ultrasound. In this paper, we investigate reconstruction of the acoustic impedance from ultrasound images for the first time. Similar to spatial compounding, we combine multiple images to improve the estimation. We use phase information to determine regions of high reflection from an ultrasound image. We model the physical imaging process with an emphasis on the reflection of sound waves. The model is used in computing the acoustic impedance (up to a scale) from areas of high reflectivity. The acoustic impedance image can either be directly visualized or be used in simulation of ultrasound images from an arbitrary point of view. The experiments performed on in-vitro and in-vivo data show promising results.
AB - Reflection of sound waves, due to acoustic impedance mismatch at the interface of two media, is the principal physical property which allows visualization with ultrasound. In this paper, we investigate reconstruction of the acoustic impedance from ultrasound images for the first time. Similar to spatial compounding, we combine multiple images to improve the estimation. We use phase information to determine regions of high reflection from an ultrasound image. We model the physical imaging process with an emphasis on the reflection of sound waves. The model is used in computing the acoustic impedance (up to a scale) from areas of high reflectivity. The acoustic impedance image can either be directly visualized or be used in simulation of ultrasound images from an arbitrary point of view. The experiments performed on in-vitro and in-vivo data show promising results.
UR - http://www.scopus.com/inward/record.url?scp=51849124560&partnerID=8YFLogxK
U2 - 10.1109/CVPRW.2008.4563028
DO - 10.1109/CVPRW.2008.4563028
M3 - Conference contribution
SN - 9781424423408
T3 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
BT - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
T2 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
Y2 - 23 June 2008 through 28 June 2008
ER -