Evaluating plasmonic light trapping with photoluminescence

Chog Barugkin, Yimao Wan, Daniel Macdonald, Kylie R. Catchpole

    Research output: Contribution to journalArticlepeer-review

    18 Citations (Scopus)

    Abstract

    We use photoluminescence measurements to quantify the light trapping for a range of plasmonic structures. By combining Ag nanoparticles as a scattering structure and diffuse white paint as a back surface reflector (BSR) on silicon wafers, we can achieve absorption enhancement of 62% of the Lambertian value, which is comparable with literature values for inverted pyramids of 67%. Through measurements of the effective carrier lifetime, we also establish that plasmonic Ag particles do not degrade the electrical properties of the passivation layer.

    Original languageEnglish
    Article number6575129
    Pages (from-to)1292-1297
    Number of pages6
    JournalIEEE Journal of Photovoltaics
    Volume3
    Issue number4
    DOIs
    Publication statusPublished - 2013

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