Evidence of blocking effect on carrier trapping process by necking region in very narrow AIGaAs/GaAs V-grooved quantum wire structure

Transient band-gap renormalization (BGR) effects are investigated in AlGaAs/GaAs V-grooved quantum structures. The temperature-dependent transient BGR effects in the sidewall quantum well (SQWL) provide direct evidence of the existence of the blocking effect by the necking region barrier on the carrier trapping process. These effects provide a useful method to show the existence of the necking region, particularly for very thin SQWL structures. The temperature-dependent lifetimes of the SQWL and quantum wire (QWR) provide further proof of the carrier trapping process from the SQWL to the QWR.