EXAFS characterisation of Ge nanocrystals in silica

M. C. Ridgway^*, G. De M. Azevedo, C. J. Glover, R. G. Elliman, D. J. Llewellyn, A. Cheung, B. Johannessen, D. A. Brett, G. J. Foran

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review