EXAFS study of the structural properties of in and in + C implanted Ge

R. Feng, F. Kremer, D. J. Sprouster, S. Mirzaei, S. Decoster, C. J. Glover, S. A. Medling, S. P. Russo, M. C. Ridgway

    Research output: Contribution to journal › Conference article › peer-review

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    Chemistry