Abstract
The reference scan method is a simple yet powerful method for measuring spatial drift of the x-ray spot during a lowcone-angle μ-CT experiment. As long as the drift is smooth, and occurring on a time scale that is long compared to the acquisition time of each projection, this method provides a way to compensate for the drift by applying 2D in-plane translations to the radiographs. Here we show that this compensation may be extended to the regime of high-magnification, high-cone-angle CT experiments where source drift perpendicular to the detector plane can cause significant magnification changes throughout the acquisition.
Original language | English |
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Pages (from-to) | 4809-4811 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 36 |
Issue number | 24 |
DOIs | |
Publication status | Published - 15 Dec 2011 |