Extraction of Recombination Properties from Lifetime Data

Gaby J.M. Janssen; Yu Wu; Kees C.J.J. Tool; Ingrid G. Romijn; Andreas Fell

doi:10.1016/j.egypro.2016.07.034

Extraction of Recombination Properties from Lifetime Data

Gaby J.M. Janssen^*, Yu Wu, Kees C.J.J. Tool, Ingrid G. Romijn, Andreas Fell

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

9 Citations (Scopus)

Abstract

Extraction of recombination properties like the recombination pre-factor J₀ and the Shockley-Read-Hall base lifetime from photoconductance data on test structures and half-fabricates of photovoltaic cells is not always straightforward and unambiguous. In this paper the well-known "slope method" of Kane and Swanson will be compared to the method offered by the Quokka code. The Quokka code numerically solves the distribution of the excess carrier concentration over the thickness of the wafer at several injection levels. In this way artefacts due to transport limitations are avoided and the analysis does not rely on data at a single injection level. This gives more reliable results for J₀ and the base lifetime. A method to the determine the base lifetime from the implied V_OC at 1 Sun illumination values is also presented.

Original language	English
Pages (from-to)	88-95
Number of pages	8
Journal	Energy Procedia
Volume	92
DOIs	https://doi.org/10.1016/j.egypro.2016.07.034
Publication status	Published - 1 Aug 2016
Event	6th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2016 - Chambery, France Duration: 7 Mar 2016 → 9 Mar 2016

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10.1016/j.egypro.2016.07.034

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@article{19482a03c8cf435e88bb60725fd0190a,

title = "Extraction of Recombination Properties from Lifetime Data",

abstract = "Extraction of recombination properties like the recombination pre-factor J0 and the Shockley-Read-Hall base lifetime from photoconductance data on test structures and half-fabricates of photovoltaic cells is not always straightforward and unambiguous. In this paper the well-known {"}slope method{"} of Kane and Swanson will be compared to the method offered by the Quokka code. The Quokka code numerically solves the distribution of the excess carrier concentration over the thickness of the wafer at several injection levels. In this way artefacts due to transport limitations are avoided and the analysis does not rely on data at a single injection level. This gives more reliable results for J0 and the base lifetime. A method to the determine the base lifetime from the implied VOC at 1 Sun illumination values is also presented.",

keywords = "dark saturation current, lifetime, QSSPC, recombination, silicon photovoltaic cells",

author = "Janssen, \{Gaby J.M.\} and Yu Wu and Tool, \{Kees C.J.J.\} and Romijn, \{Ingrid G.\} and Andreas Fell",

year = "2016",

month = aug,

day = "1",

doi = "10.1016/j.egypro.2016.07.034",

language = "English",

volume = "92",

pages = "88--95",

journal = "Energy Procedia",

issn = "1876-6102",

publisher = "Elsevier Ltd.",

note = "6th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2016 ; Conference date: 07-03-2016 Through 09-03-2016",

}

TY - JOUR

T1 - Extraction of Recombination Properties from Lifetime Data

AU - Janssen, Gaby J.M.

AU - Wu, Yu

AU - Tool, Kees C.J.J.

AU - Romijn, Ingrid G.

AU - Fell, Andreas

PY - 2016/8/1

Y1 - 2016/8/1

N2 - Extraction of recombination properties like the recombination pre-factor J0 and the Shockley-Read-Hall base lifetime from photoconductance data on test structures and half-fabricates of photovoltaic cells is not always straightforward and unambiguous. In this paper the well-known "slope method" of Kane and Swanson will be compared to the method offered by the Quokka code. The Quokka code numerically solves the distribution of the excess carrier concentration over the thickness of the wafer at several injection levels. In this way artefacts due to transport limitations are avoided and the analysis does not rely on data at a single injection level. This gives more reliable results for J0 and the base lifetime. A method to the determine the base lifetime from the implied VOC at 1 Sun illumination values is also presented.

AB - Extraction of recombination properties like the recombination pre-factor J0 and the Shockley-Read-Hall base lifetime from photoconductance data on test structures and half-fabricates of photovoltaic cells is not always straightforward and unambiguous. In this paper the well-known "slope method" of Kane and Swanson will be compared to the method offered by the Quokka code. The Quokka code numerically solves the distribution of the excess carrier concentration over the thickness of the wafer at several injection levels. In this way artefacts due to transport limitations are avoided and the analysis does not rely on data at a single injection level. This gives more reliable results for J0 and the base lifetime. A method to the determine the base lifetime from the implied VOC at 1 Sun illumination values is also presented.

KW - dark saturation current

KW - lifetime

KW - QSSPC

KW - recombination

KW - silicon photovoltaic cells

UR - http://www.scopus.com/inward/record.url?scp=85014446369&partnerID=8YFLogxK

U2 - 10.1016/j.egypro.2016.07.034

DO - 10.1016/j.egypro.2016.07.034

M3 - Conference article

AN - SCOPUS:85014446369

SN - 1876-6102

VL - 92

SP - 88

EP - 95

JO - Energy Procedia

JF - Energy Procedia

T2 - 6th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2016

Y2 - 7 March 2016 through 9 March 2016

ER -

Extraction of Recombination Properties from Lifetime Data

Abstract

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