Fast high-resolution micro-CT with exact reconstruction methods

T. Varslot*, A. Kingston, A. Sheppard, A. Sakellariou

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Citations (Scopus)

    Abstract

    We have constructed a helical trajectory X-ray micro-CT system which enables high-resolution tomography within practical acquisition times. In the quest for ever-increasing resolution, lab-based X-ray micro-CT systems are limited by the spot size of the X-ray source. Unfortunately, decreasing the spot size reduces the X-ray flux, and therefore the signal-to-noise ratio (SNR). The reduced source flux can be offset by moving the detector closer to the source, thereby capturing a larger solid angle of the X-ray beam. We employ a helical scanning trajectory, accompanied by an exact reconstruction method to avoid the artifacts resulting from the use of large cone-angles with circular trajectories. In this paper, we present some challenges which arise when adopting this approach in a high-resolution cone-beam micro-CT system.

    Original languageEnglish
    Title of host publicationDevelopments in X-Ray Tomography VII
    DOIs
    Publication statusPublished - 2010
    EventDevelopments in X-Ray Tomography VII - San Diego, CA, United States
    Duration: 2 Aug 20105 Aug 2010

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume7804
    ISSN (Print)0277-786X

    Conference

    ConferenceDevelopments in X-Ray Tomography VII
    Country/TerritoryUnited States
    CitySan Diego, CA
    Period2/08/105/08/10

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