TY - GEN
T1 - Feedback design for quantum state manipulation by measurements
AU - Fu, Shuangshuang
AU - Shi, Guodong
AU - Proutiere, Alexandre
AU - James, Matthew R.
N1 - Publisher Copyright:
© 2015 American Automatic Control Council.
PY - 2015/7/28
Y1 - 2015/7/28
N2 - In this paper, we propose feedback designs for manipulating a quantum state to a target state by performing sequential measurements. In light of Belavkin's quantum feedback control theory, for a given set of (projective or non-projective) measurements and a given time horizon, we show that finding the measurement selection policy that maximizes the successful manipulation is an optimal control problem for a controlled Markovian process. The optimal policy is Markovian and can be solved by dynamical programming. Numerical examples indicate that making use of feedback information significantly improves the success probability compared to classical scheme without taking feedback.
AB - In this paper, we propose feedback designs for manipulating a quantum state to a target state by performing sequential measurements. In light of Belavkin's quantum feedback control theory, for a given set of (projective or non-projective) measurements and a given time horizon, we show that finding the measurement selection policy that maximizes the successful manipulation is an optimal control problem for a controlled Markovian process. The optimal policy is Markovian and can be solved by dynamical programming. Numerical examples indicate that making use of feedback information significantly improves the success probability compared to classical scheme without taking feedback.
KW - Quantum measurement
KW - Quantum state manipulation
KW - Stochastic optimal control
UR - http://www.scopus.com/inward/record.url?scp=84940948102&partnerID=8YFLogxK
U2 - 10.1109/ACC.2015.7170719
DO - 10.1109/ACC.2015.7170719
M3 - Conference contribution
T3 - Proceedings of the American Control Conference
SP - 104
EP - 107
BT - ACC 2015 - 2015 American Control Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 American Control Conference, ACC 2015
Y2 - 1 July 2015 through 3 July 2015
ER -