Abstract
The formation of ferromagnetic Ga1-xMnxAs films were demonstrated by Mn ion implantation into GaAs followed by pulsed-laser melting. The remanent magnetization persisting above 85K was observed for samples with x≈0.10, in which 40% of the Mn resides on substitutional lattice sites. The ferromagnetism in Ga1-xMnxAs was found robust to the presence of structural defects.
| Original language | English |
|---|---|
| Pages (from-to) | 1251-1253 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 82 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 24 Feb 2003 |
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