Flexible phases, modulated structures and the transmission electron microscope

Ray L. Withers*, Lasse Norén, Yun Liu

*Corresponding author for this work

    Research output: Contribution to journalReview articlepeer-review

    6 Citations (Scopus)

    Abstract

    A review of the application of transmission electron microscopy to the study of interface, composite and displacively modulated structures is given. The distinctly different mechanisms underlying structural modulation in each case are emphasized as is the practical application of transmission electron microscopy to problems such as pseudo-symmetry and twinning, to indexation in (3+d)-dimensional superspace and to overall superspace symmetry and structural characterization.

    Original languageEnglish
    Pages (from-to)701-710
    Number of pages10
    JournalZeitschfrift fur Kristallographie
    Volume219
    Issue number11
    DOIs
    Publication statusPublished - 2004

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