Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Ying Chen*, Hua Chen, Jun Yu, James S. Williams, Vince Craig

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    6 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes'. Together they form a unique fingerprint.

    Material Science