Force microscopy and surface interactions

Tim J. Senden

doi:10.1016/S1359-0294(01)00067-X

Force microscopy and surface interactions

Tim J. Senden^*

^*Corresponding author for this work

Research output: Contribution to journal › Review article › peer-review

134 Citations (Scopus)

Abstract

The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules.

Original language	English
Pages (from-to)	95-101
Number of pages	7
Journal	Current Opinion in Colloid and Interface Science
Volume	6
Issue number	2
DOIs	https://doi.org/10.1016/S1359-0294(01)00067-X
Publication status	Published - May 2001

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title = "Force microscopy and surface interactions",

abstract = "The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules.",

keywords = "Atomic force microscopy, Cantilever, Colloids, Force spectroscopy, Single molecule elongation, Surface force measurement, Thermal noise, Tip-sample interactions",

author = "Senden, {Tim J.}",

year = "2001",

month = may,

doi = "10.1016/S1359-0294(01)00067-X",

language = "English",

volume = "6",

pages = "95--101",

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T1 - Force microscopy and surface interactions

AU - Senden, Tim J.

PY - 2001/5

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N2 - The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules.

AB - The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules.

KW - Atomic force microscopy

KW - Cantilever

KW - Colloids

KW - Force spectroscopy

KW - Single molecule elongation

KW - Surface force measurement

KW - Thermal noise

KW - Tip-sample interactions

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U2 - 10.1016/S1359-0294(01)00067-X

DO - 10.1016/S1359-0294(01)00067-X

M3 - Review article

SN - 1359-0294

VL - 6

SP - 95

EP - 101

JO - Current Opinion in Colloid and Interface Science

JF - Current Opinion in Colloid and Interface Science

IS - 2

ER -

Force microscopy and surface interactions

Abstract

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