Gallium contacts on p-type silicon substrates

M. F. Stuckings*, B. Fischer, G. Giroult, A. Cuevas, M. J. Stocks, A. W. Blakers

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)

    Abstract

    A significant reduction in contact resistance of palladium/silicon contacts was realised by the use of a thin intermediate gallium layer. The contact resistance of the palladium/gallium/silicon contact was found to be similar to aluminium/silicon contacts on 0·5 Ω cm silicon. Solar cells processed on 1 Ω cm substrates with this structure demonstrated better contact properties than conventional aluminium/silicon contacts. The improved characteristics are believed to be a result of gallium/silicon alloying at low temperature (400°C). The palladium layer is critical as aluminium/gallium/silicon layers show dramatically increased contact resistance. The palladium silicide may interact with the aluminium layer to form a stable ternary compound, preventing aluminium from penetrating deeper into the silicon.

    Original languageEnglish
    Pages (from-to)409-416
    Number of pages8
    JournalProgress in Photovoltaics: Research and Applications
    Volume9
    Issue number6
    DOIs
    Publication statusPublished - Nov 2001

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