Generation of a phase-flipped Gaussian mode for optical measurements

V. Delaubert; D. A. Shaddock; P. K. Lam; B. C. Buchler; H. A. Bachor; D. E. McClelland

doi:10.1088/1464-4258/4/4/305

Generation of a phase-flipped Gaussian mode for optical measurements

V. Delaubert^*
, D. A. Shaddock
, P. K. Lam
, B. C. Buchler
, H. A. Bachor
, D. E. McClelland

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

We propose optical techniques for the generation of a TEM₀₀ Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.

Original language	English
Article number	305
Pages (from-to)	393-399
Number of pages	7
Journal	Journal of Optics A: Pure and Applied Optics
Volume	4
Issue number	4
DOIs	https://doi.org/10.1088/1464-4258/4/4/305
Publication status	Published - Jul 2002

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abstract = "We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.",

keywords = "Displacement measurement, Interferometry, Phase plate, Sagnac, Spatial mode",

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AU - Delaubert, V.

AU - Shaddock, D. A.

AU - Lam, P. K.

AU - Buchler, B. C.

AU - Bachor, H. A.

AU - McClelland, D. E.

PY - 2002/7

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N2 - We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.

AB - We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.

KW - Displacement measurement

KW - Interferometry

KW - Phase plate

KW - Sagnac

KW - Spatial mode

UR - https://www.scopus.com/pages/publications/0036649071

U2 - 10.1088/1464-4258/4/4/305

DO - 10.1088/1464-4258/4/4/305

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ER -

Generation of a phase-flipped Gaussian mode for optical measurements

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