Abstract
Minimizing carrier recombination at cell contacts becomes increasingly important for reaching high efficiency. In this work, the passivated contact concept is implemented into n-type silicon solar cells with laser-processed local back surface fields. The passivation and contact characteristics of the SiO2/amorphous silicon (a-Si:H) stack on localized laser doped n+ regions are investigated. We find that the SiO2/a-Si:H stack provides not only good passivation to laser doped n+ regions but also allows a low contact resistivity after thermal annealing. With the implementation of the SiO2/a-Si:H passivated contact, an absolute efficiency gain of up to 1.5% is achieved for n-type solar cells.
Original language | English |
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Article number | 113901 |
Journal | Applied Physics Letters |
Volume | 106 |
Issue number | 11 |
DOIs | |
Publication status | Published - 16 Mar 2015 |