@inproceedings{7c15f2fbb73b417aa8c9b85dc8d979f8,
title = "High performance control of atomic force microscope for high-speed image scanning",
abstract = "This paper presents the design of a model predictive control (MPC) scheme with a notch filter for reducing the tracking error of an atomic force microscope (AFM) by damping the resonant mode of the piezoelectric tube (PZT) scanner. The development of a controller for the AFM imaging and scanning speed is illustrated in this paper. Experimental results show that the proposed controller can increase the scanning speed significantly as compared with the existing PI controller.",
author = "Rana, {M. S.} and Pota, {H. R.} and Petersen, {I. R.}",
year = "2012",
doi = "10.1109/ICARCV.2012.6485355",
language = "English",
isbn = "9781467318716",
series = "2012 12th International Conference on Control, Automation, Robotics and Vision, ICARCV 2012",
pages = "1187--1192",
booktitle = "2012 12th International Conference on Control, Automation, Robotics and Vision, ICARCV 2012",
note = "2012 12th International Conference on Control, Automation, Robotics and Vision, ICARCV 2012 ; Conference date: 05-12-2012 Through 07-12-2012",
}