High-resolution optical sampling of 640-Gb/s data using four-wave mixing in dispersion-engineered highly nonlinear As2S3 planar waveguides

Jürgen Van Erps*, Feng Luan, Mark D. Pelusi, Tim Iredale, Steve Madden, Duk Yong Choi, Douglas A. Bulla, Barry Luther-Davies, Hugo Thienpont, Benjamin J. Eggleton

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    55 Citations (Scopus)

    Abstract

    We present the first demonstration of an optical sampling system, using the optical Kerr effect in a chip-scale device, enabling combined capability for femtosecond resolution and broadband signal wavelength tunability. A temporal resolution <500 fs is achieved using four-wave mixing in a 7-cm-short chalcogenide planar waveguide. The use of a short length, dispersion-shifted waveguide with ultrahigh nonlinearity (104W -1·km-1) enables high-resolution optical sampling without the detrimental effect of chromatic dispersion on the temporal distortion of the signal and sampling pulses, as well as their phase mismatch. Using the device, we successfully monitor a 640-Gb/s optical time-division multiplexing (OTDM) datastream, showcasing its potential for integrated chip-based monitoring of signals at bitrates approaching and beyond Tb/s. We discuss fundamental limitations and potential improvements.

    Original languageEnglish
    Article number5308237
    Pages (from-to)209-215
    Number of pages7
    JournalJournal of Lightwave Technology
    Volume28
    Issue number2
    DOIs
    Publication statusPublished - 15 Jan 2010

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